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TOPSHOTS-FASHION-CHINA


A model presents a creation by Chinese fashion house BIFT & Taiwan USC Graduates Show during the China Fashion Week in Beijing on March 27, 2010. The bi-annual fashion event highlights the latest designs by domestic and international designers. TOPSHOTS AFP PHOTO/Franko Lee

Detalii fotografie
Loc:     Beijing, CHINA
Sursa:   AFP / Mediafax Foto
Fotograf:   Franko Lee
Data:   26 Martie 2010
Dimensiuni:   1984 x 3000 (902.59 KB)
Cuvinte cheie:
TOPSHOTS FASHION CHINA VERTICAL